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SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994

All American Scales & Calibration can calibrate multimeters (DDM, handheld, bench), process calibrators, and more. In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to our laboratory to perform the following Electrical calibrations for DC Voltage, DC Current, Resistance, Electrical Calibration of RTD Indicators and Indicating System, Electrical Calibration of Thermocouple Indicators and Indicating Systems, AC Voltage, and AC Current.

Please see full details below or on our full Scope of Accreditation (PDF) or learn more about our in-lab calibration service.

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Electrical – DC/Low Frequency Calibration Scope Includes:

Parameter/Equipment

Range

CMC 2,4, 5 (±)

Comments

DC Voltage – Generate3

(0 to 330) mV

330 mV to 3.3

V

(3.3 to 33) V

(3 to 330) V

(330 to 1000) V

27 μV/V + 1 μV

4 μV/V + 2 μV

15 μV/V + 20 μV

22 μV/V + 150 μV

23 μV/V + 1.5 mV

Method: ACP-070; Fluke 5522A

DC Voltage – Measure3

(0 to 100) mV
100mV to 1V
(1 to 10) V
(10 to 100) V
(100 to 1000) V

Up to 6000 V

22 μV/V + 1 μV
22 μV/V + 2 μV
21 μV/V + 12 μV
28 μV/V + 150 μV
31 μV/V + 5 mV

10 mV/V + 12 μV

Method: ACP-070; Keithley DMM7510

Fluke 80K-6 HV probe, Tektronix P6015 HV probe, Keithley DMM7510

DC Current – Generate3

Non-Toroidal Type

(0 to 330) μA
330 μA to 3.3 mA
(3.3 to 33) mA
(33 to 330) mA
330 mA to 1 A
(1 to 3) A
(3 to 10) A
(10 to 20) A

(10 to 1000) A

170 μA/A + 0.02 μA
130 μA/A + 0.05 μA
120 μA/A + 0.25 μA
120 μA/A + 2.5 μA
230 μA/A + 40 μA
430 μA/A + 40 μA
510 μA/A + 500 μA
1.2 mA/A + 750 μA

0.8 %

Method: ACP-070; Fluke 5522A

Fluke 5522A plus coil, clamp-on only

DC Current – Measure3

(0 to 10) μA
(10 to 100) μA
100 μA to 1 mA
(1 to 10) mA
(10 to 100) mA
100 mAto 1A
(1 to 3) A
(3 to 10) A

(10 to 100) A
(100 to 1000) A

100 μA/A + 0.3 nA
70 μA/A + 1 nA
70 μA/A + 9 nA
71 μA/A + 0.1 nA
85 μA/A + 1 μA
490 μA/A + 50 μA
500 μA/A + 120 μA
1.8 mA/A + 3 mA

3 mA/A + 1 μA
3 mA/A + 1 μA

Method: ACP-070;

Keithley DMM7510

Keithley DMM7510 with Empro shunts

Resistance – Generate3

(0 to 11) Ω
(11 to 33) Ω
(33 to 110) Ω
(110 to 330) Ω
330 Ω to 1.1 kΩ
(1.1 to 3.3) kΩ
(3.3 to 11) kΩ
(11 to 33) kΩ
(33 to 110) kΩ
(110 to 330) kΩ
330 kΩ to 1.1 MΩ
(1.1 to 3.3) MΩ
(3.3 to 11) MΩ
(11 to 33) MΩ
(33 to 110) MΩ
(110 to 330) MΩ
(330 to 1100) MΩ

0.005 % + 1 mΩ
0.004 % + 1.5
mΩ 0.004 % + 1.4 mΩ
0.033 % + 2 mΩ
0.004 % + 20 mΩ
0.004 % + 20 mΩ
0.004 % + 20 mΩ
0.004 % + 0.2 Ω
0.004 % + 0.2 Ω
0.004 % + 2 Ω
0.011 % + 2 Ω
0.015 % + 30 Ω
0.041 % + 50 Ω
0.056 % + 2500 Ω
0.07 % + 3 KΩ
0.38 % + 100 kΩ
1.8 % + 500 kΩ

Method: ACP-070;

Fluke 5522A

Resistance – Measure3

(0 to 10) Ω
(10 to 100) Ω
100 Ω to 1 kΩ
(1 to 10) kΩ
(10 to 100) kΩ
100 kΩ to 1 MΩ
(1 to 10) MΩ
(10 to 100) MΩ
100 MΩ to 1 GΩ

0.006 % + 0.05 mΩ
0.006 % + 0.4 mΩ
0.005 % + 3 mΩ
0.005 % + 30 mΩ
0.006 % + 0.3 Ω
0.011 % + 5 Ω
0.03 % + 100 Ω
0.006 % + 0.4 mΩ
0.93 % + 200 kΩ

Method: ACP-070;

Keithley DMM7510

Electrical Calibration of RTD Indicators & Indicating System3 – Generate Simulation

Pt 385, 100 Ω

(-200 to 800) °C

0.08 °C

Method: ACP-070;

Fluke 5522A

Electrical Calibration of RTD Indicators & Indicating System3 – Measure Simulation

Pt 385, 100 Ω

(-200 to 800) °C

0.08 °C

Method: ACP-070;

Keithley DMM7510

Electrical Calibration of Thermocouple Indicators & Indicating Systems3 –

Type E

Type J

Type K

Type N

Type R

Type S

Type T

(-250 to 1000) °C

(-210 to -100) °C
(-100 to 760) °C
(760 to 1200) °C

(-200 to 100) °C
(-100 to 120) °C
(120 to 1000) °C
(1000 to 1372) °C

(-200 to 1300) °C

(0 to 1767) °C

(-250 to 400) °C
(-150 to 400) °C

0.24 °C

0.31 °C
0.16 °C
0.27 °C

0.38 °C
0.19 °C
0.30 °C
0.46 °C

0.31 °C

0.65 °C

0.54 °C

0.72 °C
0.16 °C

Method: ACP-070;

Fluke 5522A

AC Voltage – Generate3

(1 to 33) mV

(33 to 330) mV

330 mV to 3.3 V

(3.3 to 33) V

(33 to 330) V

(330 to 1000) V

(10 to 45) Hz
45 Hz to 10 kHz
(10 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 500) kHz

45 Hz to 1 kHz
(1 to 10) kHz
(10 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz

45 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz

0.018 % + 6 μV
0.018 % + 6 μV
0.025 % + 6 μV
0.12 % + 6 μV
0.4 % + 12 μV
0.91 % + 50 μV

0.034 % + 8 μV
0.017 % + 8 μV
0.019 % + 8 μV
0.04 % + 8 μV
0.091 % + 32 μV
0.23 % + 70 μV

0.02 % + 60 μV
0.02 % + 60 μV
0.035 % + 50 μV
0.08 % + 50 μV
0.28 % + 600 μV
0.28 % + 600 μV

0.018 % + 600 μV
0.018 % + 600 μV
0.03 % + 600 μV
0.04 % + 600 μV
0.11 % + 1.6 mV

0.022 % + 2 mV
0.017 % + 8 μV
0.029 % + 6 mV
0.036 % + 6 mV
0.23 % + 50 mV

0.035 % + 10 mV
0.03 % + 10 mV
0.035 % + 10 mV

Method: ACP-070;

Fluke 5522A

AC Voltage – Measure3

(0 to 100) mV

(100mV to 1V)

(1 to 10) V

(10 to 100) V

(100 to 700) V

(700 to 6000) V

30 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz

(50 to 1) kHz

0.09 % + 0.03 mV
0.18 % + 0.05 mV
0.11 % + 0.08 mV
4.6 % + 0.5 mV

0.07 % + 0.3 mV
0.17 % + 0.5 mV
0.08 % + 0.8 mV
4.7 % + 5 mV

0.071 % + 3 mV
0.17 % + 5 mV
0.7 % + 8 mV
4.7 % + 50 mV

0.075 % + 0.03 V
0.17 % + 0.05 V
0.7 % + 0.08 V
4.7 % + 0.5 V

0.13 % + 0.21 V
0.2 % + 0.35 V
0.76 % + 0.56 V
4.6 % + 3.5 V

0.06 % + 3 mV

Method: ACP-070;
Keithley DMM7510

Fluke 80K-6 HV probe,
Tektronix P6015 HV probe,
Keithley DMM7510

AC Current – Generate3

(29 to 330) μA
330 μA to 3.3 mA
(3.3 to 33) mA
(33 to 330) mA

330mA to 1 A

330 mAto 3A
(2 to 20) A

Up to 10A

(10 to 300) A
(300 to 1000) A

10 Hz to 30 kHz

5 Hz to 10 Hz
10 Hz to 1 kHz
1 kHz to 10 kHz

50 Hz to 1 kHz
1 kHz to 5 kHz

1 Hz to 5 kHz

60 Hz to 440 Hz
60 Hz to 440 Hz
60 Hz

0.15 % + 0.1 μA
0.12 % + 0.15 μA
0.042 % + 2 μA
0.047 % + 20 μA

0.21 % + 100 μA
0.06 % + 100 μA
2.9 % + 5 mA

0.074 % + 100 μA
0.7 % + 1 mA

0.18 % + 5 mA

1.3 %
1.0 %
0.4 %

Method: ACP-070;

Fluke 5522A

Fluke 5522A plus coil,

clamp-on only

AC Current – Measure3

(5 to 100) μA

100 μA to 1 mA

(1 to 10) mA

(10 to 100) mA
100 mAto 1A

(1 to 3) A

(3 to 10) A

40 Hz to 5 kHz
(5 to 10) kHz

40 Hz to 10 kHz

40 Hz to 10 kHz
(5 to 10) kHz

40 Hz to 5 kHz
(5 to 10) kHz

0.07 % + 300 nA
0.11 % + 300 nA

0.15 % + 300 nA

0.11 % + 3 μA

0.11 % + 30 μA

1.1 % + 400 μA
2.3 % + 400 μA

1 % + 1.5 mA
2.3 % + 1.5mA

1 % + 5 mA
2.3 % + 5 mA

Method: ACP-070;

Keithley DMM7510

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Certificate Number: 1848.01

1 This laboratory offers commercial calibration & field calibration services.

2 Calibration & Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device & to influences from the circumstances of the specific calibration.

3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration & for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered & this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

4 In the statement of CMC, percentages are percentage of reading, unless otherwise indicated, L is the numerical value of the nominal length of the device measured in inches, R is the numerical value of the resolution of the device in microinches, D is the numerical value of the nominal diameter of the device measured in inches, I.V. represents “Indicated Value”, & Ra is the numerical value of the nominal roughness of the surface measured in micrometers roughness.

5 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction/percentage of the reading plus a fixed floor specification.

6 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.

7 This scope meets A2LA’s P112 Flexible Scope Policy.

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Electrical – DC/Low Frequency Calibration Scope Includes:

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