Electrical Calibration
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994
All American Scales & Calibration can calibrate multimeters (DDM, handheld, bench), process calibrators, and more. In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to our laboratory to perform the following Electrical calibrations for DC Voltage, DC Current, Resistance, Electrical Calibration of RTD Indicators and Indicating System, Electrical Calibration of Thermocouple Indicators and Indicating Systems, AC Voltage, and AC Current.
Please see full details below or on our full Scope of Accreditation (PDF) or learn more about our in-lab calibration service.
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Electrical – DC/Low Frequency Calibration Scope Includes:
|
Parameter/Equipment |
Range | CMC 2,4, 5 (±) | Comments |
|
DC Voltage – Generate3
|
(0 to 330) mV 330 mV to 3.3 V (3.3 to 33) V (3 to 330) V (330 to 1000) V |
27 μV/V + 1 μV 4 μV/V + 2 μV 15 μV/V + 20 μV 22 μV/V + 150 μV 23 μV/V + 1.5 mV |
Method: ACP-070; Fluke 5522A
|
|
DC Voltage – Measure3
|
(0 to 100) mV Up to 6000 V |
22 μV/V + 1 μV
|
Method: ACP-070; Keithley DMM7510
Fluke 80K-6 HV probe, Tektronix P6015 HV probe, Keithley DMM7510 |
|
DC Current – Generate3
Non-Toroidal Type
|
(0 to 330) μA (10 to 1000) A |
170 μA/A + 0.02 μA 0.8 % |
Method: ACP-070; Fluke 5522A
Fluke 5522A plus coil, clamp-on only |
|
DC Current – Measure3
|
(0 to 10) μA (10 to 100) A |
100 μA/A + 0.3 nA 3 mA/A + 1 μA |
Method: ACP-070; Keithley DMM7510
Keithley DMM7510 with Empro shunts |
|
Resistance – Generate3
|
(0 to 11) Ω (11 to 33) Ω (33 to 110) Ω (110 to 330) Ω 330 Ω to 1.1 kΩ (1.1 to 3.3) kΩ (3.3 to 11) kΩ (11 to 33) kΩ (33 to 110) kΩ (110 to 330) kΩ 330 kΩ to 1.1 MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ (33 to 110) MΩ (110 to 330) MΩ (330 to 1100) MΩ |
0.005 % + 1 mΩ |
Method: ACP-070; Fluke 5522A |
|
Resistance – Measure3
|
(0 to 10) Ω |
0.006 % + 0.05 mΩ |
Method: ACP-070; Keithley DMM7510
|
|
Electrical Calibration of RTD Indicators & Indicating System3 – Generate Simulation Pt 385, 100 Ω |
(-200 to 800) °C |
0.08 °C |
Method: ACP-070; Fluke 5522A |
|
Electrical Calibration of RTD Indicators & Indicating System3 – Measure Simulation Pt 385, 100 Ω |
(-200 to 800) °C | 0.08 °C |
Method: ACP-070; Keithley DMM7510 |
|
Electrical Calibration of Thermocouple Indicators & Indicating Systems3 – Type E Type J
Type K
Type N Type R Type S
Type T |
(-250 to 1000) °C (-210 to -100) °C (-200 to 100) °C (-200 to 1300) °C (0 to 1767) °C (0 to 1767) °C (-250 to 400) °C |
0.24 °C 0.31 °C 0.38 °C 0.31 °C 0.65 °C 0.54 °C 0.72 °C |
Method: ACP-070; Fluke 5522A
|
|
AC Voltage – Generate3 (1 to 33) mV
(33 to 330) mV
330 mV to 3.3 V
(3.3 to 33) V
(33 to 330) V
(330 to 1000) V
|
(10 to 45) Hz (10 to 45) Hz (10 to 45) Hz 45 Hz to 1 kHz 45 Hz to 1 kHz 45 Hz to 1 kHz |
0.018 % + 6 μV 0.034 % + 8 μV 0.02 % + 60 μV 0.018 % + 600 μV 0.022 % + 2 mV 0.035 % + 10 mV |
Method: ACP-070;
Fluke 5522A
|
|
AC Voltage – Measure3
(0 to 100) mV
(100mV to 1V)
(1 to 10) V
(10 to 100) V
(100 to 700) V
(700 to 6000) V |
30 Hz to 20 kHz 30 Hz to 20 kHz 30 Hz to 20 kHz 30 Hz to 20 kHz 30 Hz to 20 kHz (50 to 1) kHz |
0.09 % + 0.03 mV 0.07 % + 0.3 mV 0.071 % + 3 mV 0.075 % + 0.03 V 0.13 % + 0.21 V 0.06 % + 3 mV
|
Method: ACP-070;
Fluke 80K-6 HV probe, |
|
AC Current – Generate3 (29 to 330) μA
330mA to 1 A
330 mAto 3A
Up to 10A
(10 to 300) A |
10 Hz to 30 kHz
5 Hz to 10 Hz 50 Hz to 1 kHz
1 Hz to 5 kHz
60 Hz to 440 Hz |
0.15 % + 0.1 μA
0.21 % + 100 μA 0.074 % + 100 μA 0.18 % + 5 mA
1.3 % |
Method: ACP-070; Fluke 5522A
clamp-on only |
|
AC Current – Measure3 (5 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (1 to 3) A (3 to 10) A |
40 Hz to 5 kHz 40 Hz to 10 kHz 40 Hz to 10 kHz 40 Hz to 10 kHz 40 Hz to 10 kHz 40 Hz to 5 kHz 40 Hz to 5 kHz |
0.07 % + 300 nA 0.15 % + 300 nA 0.11 % + 3 μA 0.11 % + 30 μA 1.1 % + 400 μA 1 % + 1.5 mA 1 % + 5 mA |
Method: ACP-070; Keithley DMM7510
|
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See our Entire Scope of Accreditation:
Certificate Number: 1848.01
1 This laboratory offers commercial calibration & field calibration services.
2 Calibration & Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device & to influences from the circumstances of the specific calibration.
3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration & for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered & this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
4 In the statement of CMC, percentages are percentage of reading, unless otherwise indicated, L is the numerical value of the nominal length of the device measured in inches, R is the numerical value of the resolution of the device in microinches, D is the numerical value of the nominal diameter of the device measured in inches, I.V. represents “Indicated Value”, & Ra is the numerical value of the nominal roughness of the surface measured in micrometers roughness.
5 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction/percentage of the reading plus a fixed floor specification.
6 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.
7 This scope meets A2LA’s P112 Flexible Scope Policy.